Used CASCADE MICROTECH / ALESSI REL 4800 #9023027 for sale

CASCADE MICROTECH / ALESSI REL 4800 is a prober designed for high speed wafer probing applications. It offers precision testing and high accuracy in a compact and low cost package. ALESSI REL 4800 has a robust design with a modular architecture, allowing for easy upgrades and cost-effective production processing. It is the perfect solution for reliability testing, device characterization, and yield analysis. CASCADE MICROTECH REL 4800 offers excellent probing accuracy with its laser-aligned Kinematic Stylus Design that creates and maintains a fixed position of each probe over its full range of motion. This alignment is performed after each move, eliminating grating and ensuring optimal particle release. The high accuracy of REL 4800 is further enhanced with a leveled microscope glass bed that is proven to be extremely reliable and reduces user error. With its high-speed scanning capability, CASCADE MICROTECH / ALESSI REL 4800 can probe or test thousands of points in a single pass, allowing for high throughput and increased operator efficiency. ALESSI REL 4800 also features a number of advanced features to optimize effective probing. These include probe calibration features, digital laser alignment for accurate positioning, and thermal compensation for analytical stability. Moreover, CASCADE MICROTECH REL 4800 is compatible with various electrical, mechanical and fluidic test and inspection systems, allowing users to interface with third-party equipment for a complete test solution. REL 4800 is further equipped with a user-friendly touchscreen display for convenient navigation and easy set-up. In addition, CASCADE MICROTECH / ALESSI REL 4800 comes with a proprietary high-resolution camera system that ensures clean and repeatable probing results. All in all, ALESSI REL 4800 is an excellent prober for high speed wafer probing applications. Its modular architecture, high accuracy, accurate alignment, and reliable results make it a great choice for reliable testing, device characterization, and yield analysis.