Used CASCADE MICROTECH / ALESSI REL 4800 #9046544 for sale

CASCADE MICROTECH / ALESSI REL 4800 Prober is a versatile, high-performance, automated probing platform designed for wafer testing in the semiconductor industry. It provides accurate and repeatable measurements at high speeds, making it ideal for applications involving aggressive process nodes and complex device geometries. The prober has a wide range of features that make it a valuable tool for making accurate, reliable probing measurements. It has an open-architecture platform that supports many different types of probes, as well as an integrated debounce and temperature compensation system for improved accuracy and repeatability. The prober also has an advanced, easy-to-use graphical user interface (GUI), allowing users to customize their testing process and check parameters quickly and accurately. The prober has an intuitive and user-friendly interface, designed to allow operators to quickly set up measurements and accurately monitor results. It also has a flexible test planning and sequence control system, allowing users to fine-tune their probes and measurements. For improved fault identification, it has a fast, real-time data analysis and comparison feature, which adds additional flexibility in fault analysis. The prober is equipped with a joystick-based, 8-axis motorized stage for precise wafer alignment, along with a fully-automated, failsafe system designed to protect against high-voltage risks. The prober also has a variety of optional test board adaptation including high-speed CCM, DVI-A, HDMI, DVI-D, and VESA standards. The prober is compatible with ALESSI FSM Series Probers, and CASCADE MICROTECH SEM Series Probers, providing users with the ability to extend their wafer testing capabilities. It is also designed to operate in an inert atmosphere, making it an ideal choice for cleanroom enviroment applications. In conclusion, ALESSI REL 4800 Prober is a versatile, high-performance, automated probing platform designed to provide accurate and repeatable measurements at high speeds for a wide variety of applications. It has an intuitive, user-friendly interface, advanced features, optional test board adaption, and inert atmosphere operation capability, making it an ideal tool for characterizing a wide range of wafer-level ICs.