Used CASCADE MICROTECH / ALESSI REL 5500 #173029 for sale

CASCADE MICROTECH / ALESSI REL 5500 prober is an automated, high-accuracy probe station designed to provide precision electrical analysis of IC devices and circuits. The equipment is an ideal solution for manufacturing, development, and failure analysis applications requiring high accuracy and low-cost probing. ALESSI REL 5500 prober features a highly precise robot arm that can be set to move along two axes with a level of accuracy to 1 micron. This ensures that the probe contacts the sites precisely, with no possibility of device damage. CASCADE MICROTECH REL 5500 prober is designed with a number of features that make it suitable for a range of applications. It includes a number of independent, motorized stages - allowing the arm to access any site with minimal movement - and can handle a wide range of components, including ICs, 3D packages, and circuit boards. It also has an integrated autofocus system for rapid setup, as well as an automated wafer alignment unit for alignment of reticles and particles. The machine also features a variety of probe types, from spring-probe tips to push-pull probes, allowing for precise measurement of a wide range of circuit parameters. REL 5500 prober's performance is further augmented by its automation features. It has an automated planning tool, capable of programming movement around the chuck surface. This allows for easy and fast unsupervised working, with a maximum speed index of up to 3,000 steps per second. The asset can also be connected to a computer via Ethernet, allowing the user to control the model remotely. REL 5500 prober is designed for applications such as Yield Analysis, Test Protocol Generation, Failure Analysis, Thermal Testing and Process Monitoring. It provides an excellent platform for precise and accurate measurements, reducing the total cost of test in IC and chip production. Its combination of high accuracy, low-cost probing and precise automation make it an ideal choice for IC device and circuit testing.