Used CASCADE MICROTECH / ALESSI REL 5500 #293597507 for sale

CASCADE MICROTECH / ALESSI REL 5500 Prober is an advanced equipment providing comprehensive wafer probing. It has a multi-probe capability, giving users the flexibility of having multiple probe technologies for all their test needs. The system features a compact design that fits into any lab environment, allowing greater space efficiency and portability. Additionally, it is compatible with a wide range of test consumables and sensors, and also offers high resolution scanning. ALESSI REL 5500 Prober's multi-probe capability is one of its most distinct features. With this type of prober, users can choose between three primary probe types. The first is a piezoelectric scanner, which uses a high-frequency scanning assembly to enable probing with high speeds and accuracy. The second is a laser scanner, which is ideal for making small probing motions and creating highly detailed imaging. Finally, the third is a thermocouple probe, which will enable electrical measurements on a variety of materials. In addition to the features that make this prober superior for multiple probe types, the unit also provides flexible, user-friendly operation. It has an intuitive LCD touchscreen that allows users to quickly and easily set up their tests and control the prober. Furthermore, it comes with a range of programmable features, such as motorized X-Y motion and scan speeds, that give users the ability to create custom tests that suit their specific needs. CASCADE MICROTECH REL 5500 Prober also offers a number of features and options to reduce downtime and maximize efficiency. For example, it has an auto-align option that can visualize the probe in both Z and Y planes before every scan. This feature reduces the time needed to adjust, reposition, or recalibrate the wafer and probe. Other options include automatic probe alignment, an end-of-test compensation setting, and the ability to save and retrieve probe programs. These combined technologies enable REL 5500 to provide an all-in-one solution for wafer probing. Its multi-probe capability, flexible operation, and range of optional features make this prober a highly automated, user-friendly machine for efficient testing in a variety of applications.