Used CASCADE MICROTECH / ALESSI REL 5500 #9171912 for sale

CASCADE MICROTECH / ALESSI REL 5500 is an automated prober for high precision wafer-level testing. Designed for use with advanced semiconductor technologies, this system allows for precise contact alignment on device pads, vias, and other test points. The prober's advanced optics and tactile probe cards provide superior accuracy, allowing for high-speed probing with minimal manual intervention. The system is capable of probing test points down to 0.020mm in x-y direction and 0.0125mm in z direction with repeatability of 0.005mm x 0.005mm in both x-y directions. It also has a die-out tolerance of 2 microns, ensuring accurate contact with the device. The high-precision wafer and die handling allows for rapid inspection and measurement. Multiple wafer types can be loaded and tested simultaneously, with up to 8 wafers per pocket. The automated prober is capable of high-speed testing, with a maximum throughput of up to 25 wafers per hour. The adaptive software allows for custom programing suitable for each customer's testing needs. It features automated probing sequences, wafer-level device-characterization, advanced fault location, data analysis and reporting. The system also comes with an embedded test controller to manage the production process, as well as an advanced UI for user-friendly operation. ALESSI REL 5500 is designed to meet the requirements of advanced semiconductor technologies and high-volume wafer-probing applications. Its unique design combines accuracy with flexibility, making it an ideal choice for high-reliability, high-precision wafer-level testing.