Used CASCADE MICROTECH / ALESSI S 300 #293829089 for sale

CASCADE MICROTERECHCASCADE MICROTECH / ALESSI S 300 is a prober that is designed to provide accurate measurements of semiconductor wafer and integrated circuit devices. Using its high-speed scanning system, it can quickly transfer data between the prober and a PC. The system is built using a long-life, maintenance-free ScanTest device that is designed from industrial-grade components which provide reliable operation and long service life. ALESSI S300 prober provides a capability for probing multiple wafers at once, eliminating the need to move wafers into place for each test. Its scanning head is mounted on its robust, stainless steel frame, which is designed for high speed, maximum accuracy, and repeatable performance. The scanner head is adjustable on three axes, allowing for precise positioning of measurement probes relative to wafers and samples. CASCADE MICROTECH S-300 utilizes a unique MultiDUT Adapter, which allows up to seven dies from multiple wafers to be tested simultaneously. The MultiDUT Adapter provides adjustable fixture options for various die sizes, along with an adjustable support for larger dies. The MultiDUT Adapter is also compatible with Cascade's automated set-up tools including the Probe DUT Designer. S300 has integrated software that provides the ability to capture large amounts of measurement data from one wafer, and to expand data collection to multiple wafers over multiple tests. Software also includes the Prober Manager and Measurement Factory programs for forming comprehensive series of tests as well as a variety of other analysis tools. A separate Data Analysis utility allows users to view, organize, and manipulate data collected during testing quickly and easily. CASCADE MICROTECH / ALESSI S-300 provides manual calibration for optimal accuracy and repeatability. The software features easy-to-use wizards that provide step-by-step guidance for calibration processes, such as the optional backside calibration. The system also provides signal and power integrity measurements, as well as an automated procedure which allows user to identify and measure electrical characteristics of multiple dies at once. In conclusion, ALESSI S 300 is a cost-effective, reliable prober solution for automated testing of wafer and integrated circuit devices. Its advanced scanning capabilities, along with its powerful MultiDUT Adapter and software, provide an invaluable tool for efficient data analysis and accurate testing.