Used CASCADE MICROTECH / ALESSI S 300 #9267443 for sale

The Cascde MicroTechCASCADE MICROTECH / ALESSI S 300 Prober is a precision tool used in the electronics industry for testing and characterization of devices, components, and connectors. ALESSI S300 is designed for use in semiconductor failure analysis, device characterization, and production testing. The microprober features a unique single-arm gantry design that provides a heavy-duty platform for reliable long-term operation. It has a kinematic XYZ actuation equipment combined with a precision three-dimensional encoder system that ensures accurate repeatable positioning. The tool supports two-dimensional decoding for up to four probes and comes with a kinematic probe motion unit for precise probe positioning. CASCADE MICROTECH S-300 is designed to be compatible with all major industry-standard probing systems as well as Cascade's own probe cards. It supports applications requiring up to sixteen probe cards and provides an intuitive user interface for easy operation while providing improved speed and accuracy. The microprober also features an advanced autofocus machine for high-resolution imaging on devices with up to 10 micron spacing. The tool includes several advanced camera features such as variable lighting color, variable pattern settings, and real-time bias voltage control. This tool is also equipped with an advanced automatic fixture recognition asset and automatic load/unload feature to reduce cycle times. This feature is especially helpful when combined with the multiple device characterization capabilities, enabling testers to quickly and efficiently analyze multiple devices simultaneously. ALESSI S 300 is designed to operate in a wide variety of environmental conditions and offers sophisticated environmental monitoring to ensure repeatable and reliable operation. The tool is RoHS compliant and comes with a standard 24 month warranty for customer satisfaction. In conclusion, S300 Prober is a high-performance tool designed to provide precision testing and device characterization. It is an ideal choice for semiconductor failure analysis, production testing, and device characterization, as it offers versatility, accuracy, and reliability.