Used CASCADE MICROTECH / ALESSI S 300 #9313815 for sale

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ID: 9313815
Semi-automatic probe station, 12" Model no: S300-753-HT Nickel plated tri-axial vacuum chuck, 12" (2) Integrated auxiliary stages A-Zoom2 Microscope: ~1000x FEMTO Guard electrical performance Micro chamber Illuminator Anti vibration system Wafer loading support with roll out chuck Ambient temperature controller: ~200°C Probe card holder: Micro-chamber version Hard Disk Drive (HDD) included PC Control Joystick controller No air chiller unit.
CASCADE MICROTECH / ALESSI S 300 is a high-performance prober used for electrical measurement of integrated circuits or other microelectronic devices. The prober is capable of providing quick and accurate wafer probing and testing services. The prober is designed to meet the requirements of high volume users, offering measurement frequency up to 100MHz. It features advanced robotic handling and sophisticated control systems for precise positioning and measurement. Its modular construction makes it expandable and customizable to meet the specific needs of your application. The prober is built with an integrated automatic alignment system and touch sensor for repeatable accuracy. Its fully automated work flow ensures consistent and efficient testing of multiple devices simultaneously. It also offers an automated sample mounting and probing sequence, so the operator does not need to manually adjust the chuck and translate operations between each sample mount. The prober is compatible with a wide variety of probe cards and test sockets, making it suitable for a wide range of electrical characteristics and probing applications. The probe card adapter can also support a wide variety of foot print sizes and configurations to maximize measurement accuracy. The servo-driven probe motions of the prober allow for infinitely variable variable and repeatable control of the vertical and horizontal translation stages. This allows for more precise measurement and faster testing of small nodes without the need to manually adjust the probe card. The powerful robotic wafer handling and CMM-style sample staging capabilities of the prober offer faster and more accurate probing results. The prober also includes an optional sample temperature controller and software for automated wafer thermos-expansion compensation. Overall, ALESSI S300 prober offers a highly configurable and reliable testing tool for high-volume IC probing and testing applications. Its fast, precise and repeatable testing capabilities, combined with its modular design, makes it an ideal solution for advanced testing needs.
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