Used CASCADE MICROTECH / ALESSI SQ-DSM-01 #9409580 for sale

CASCADE MICROTECH / ALESSI SQ-DSM-01 prober is an advanced, multifunctional probing equipment designed to perform electrical testing and characterization of on-wafer and packaged devices. The prober is capable of testing circuits and devices in the range of nanometers to millimeters, providing a reliable and accurate solution for device characterization and failure analysis. ALESSI SQ-DSM-01 prober is equipped with an integrated pattern generator and measuring system, as well as an intelligent measurement unit that automatically adjusts settings when necessary. This feature increases test speed and accuracy. The prober can also be programmed for automated probing, providing increased throughput and reducing the need for manual input. In addition, the prober can automate prober operation to the nanometer level, enabling precise measurements to be taken without manual intervention. The prober is also equipped with a high-speed data acquisition machine and controller that allows for efficient data collection. The prober has an intuitive graphical user interface that allows for quick setup and control of measurements. This makes it easy for users to quickly and accurately perform probing and testing procedures, regardless of their experience level. The prober is compatible with a variety of standard software packages, including GDS2 and SPICE, making it a valuable tool for circuit design and analysis. The prober includes a pattern generator and 5-axis scanning tool for full-view imaging. Its multi-toe probe card design allows for simultaneous testing of 4, 8 and 16 sample sites. Its 5-axis motion asset also enables three-dimensional access to testing pads and devices. The prober is designed to handle a wide variety of substrates, ranging from simple silicon chips to complex ceramic-LGA packages. Additionally, its self-centering probes and pressure control ensure accurate and repeatable test results. The prober is also capable of local and global temperature control, allowing users to test at different temperature ranges. The model can be equipped with an integrated planar heather and laser-alignment equipment that assists users in locating test points within a device. In conclusion, CASCADE MICROTECH SQ-DSM-01 prober is a versatile, reliable, and accurate prober system for electrical testing and characterization of on-wafer and packaged devices. Its integrated pattern generator, multi-toe probe card, self-centering probes and temperature control capabilities make it ideal for circuit design and analysis. Its easy-to-use graphical user interface and compatibility with various software packages make SQ-DSM-01 prober a powerful tool for probing and testing.