Used CASCADE MICROTECH / ALESSI Summit 10000 #9040784 for sale

CASCADE MICROTECH / ALESSI Summit 10000 Prober is a high-performance, low-cost wafer prober solution for wafer testing applications. This prober enables the reliable and precise probing of a wide range of substrates. It incorporates an automated wafer alignment and a three-axis motion capability that allows for accurate probing of device geometries with extremely high accuracy. ALESSI Summit 10000 Prober utilizes a hybrid open-architecture which results in further cost savings, high reliability, and short learning curves for operators. Its implementation of computer-controlled pattern recognition helps to ensure high accuracy, repeatable performance, and low-cost operation. The equipment also boasts a sophisticated level of digital automation and flexible central, point-to-point, and parallel prober operation. The advanced features of CASCADE MICROTECH Summit 10000 Prober include an integrated wafer mapping system, which captures critical prober information in an easy to use graphical format. This information, such as number of probes and signal quality for each device tested, can be particularly helpful for quality control and troubleshooting of the unit. It also offers real-time feedback on prober settings, including pressure, wafer alignment, XY movement, z-flow leveling, and local z-height offset. Summit 10000 Prober's advanced machine architecture ensures a high level of reliability and accuracy in probing processes. Its flexible software design allows for limited programming knowledge to be used in development of optimized probing strategies. CASCADE MICROTECH / ALESSI Summit 10000 Prober's integrated vision tool can scan and interpret fiducials, allowing for automated wafer placement with arbitrary spacing. This aids in the accuracy of device alignments for larger dies and wafer maps. Automated identification of die edges and die orientation are also possible with optional equipment. In general, ALESSI Summit 10000 Prober is an ideal prober solution for high accuracy and throughput for wafer testing. Its high performance, lower cost, and sophisticated motion control capabilities make it a desirable and cost-effective prober choice for any application requiring wafer testing.