Used CASCADE MICROTECH / ALESSI Summit 11000 #9178937 for sale

CASCADE MICROTECH / ALESSI Summit 11000 is a prober designed for the testing, debugging and characterization of high-density and high-performance integrated circuits. The prober offers the highest level of performance and features for a wide variety of applications. ALESSI Summit 11000 features a flexible design to provide comprehensive probing solution for the most demanding testing and debugging environments. It offers a variety of probe configurations and wafer stages to accommodate a wide array of integrated circuits. It also supports a range of probe cards including high-density and high-performance devices. CASCADE MICROTECH Summit 11000 utilizes an innovative design to maximize throughput and increase wafer contact integrity. It is equipped with an 896 probe point capacity, which is scalable up to 11000 as needed. Additionally, the air bearing x-stage has actively-controlled motion for smoother motion routing for optimal stabilizing and contact monitoring. This ensures accurate probing results in a highly reliable testing environment. Summit 11000 features an integrated vision correction equipment to eliminate off-center wafer registration discrepancies prior to testing. Additionally, its intuitive Pass/Fail Analysis software provides users with the ability to quantitatively monitor test results and quickly evaluate device performance. The software is designed to provide real-time status monitoring of testing frequencies and yields. For maximum user convenience, the system is equipped with a user-friendly touch screen interface, allowing for easy set-up, configuration, and operation without the need for software programming. It also has built-in safety interlocks and multiple safety systems to reduce the risks of unit malfunctions. CASCADE MICROTECH / ALESSI Summit 11000 is an advanced prober machine that provides maximum throughput and testing accuracy for a variety of integrated circuits. Its intuitive user interface and monitoring capabilities ensure efficient debugging and testing of high-density and high-performance devices.