Used CASCADE MICROTECH / ALESSI Summit 12000 #293650670 for sale

CASCADE MICROTECH / ALESSI Summit 12000 is a high-performance automated prober designed for production test and electrical burn-in applications. It is a fully automated, multi-site automatic test equipment (ATE) with a small footprint. ALESSI Summit 12000 is capable of testing up to 12 test sites simultaneously, providing high throughput and uniform test coverage. It features a precision XYZ stage with a high-speed operation for rapid wafer loading and unloading. CASCADE MICROTECH Summit 12000 is a high-precision, low-noise prober featuring an XYZ stages position accuracy of ±1µm and a repeatability of ±3µm. It is equipped with a dual-optical tooling equipment for high-speed wafer alignment, and comes with a tooling adapter head that is designed to accommodate a variety of probe cards. The system is highly configurable, and can be customized with a variety of options including integrated vision systems and automated thermal chambers. Summit 12000 is capable of testing up to 200 wafers per hour, making it an ideal solution for high throughput production test applications. CASCADE MICROTECH / ALESSI Summit 12000 provides accurate and repeatable test measurements, ensuring measurable and repeatable electrical performance. Test site switching speeds are exceptionally fast, with a runtime of less than 30 milliseconds. Furthermore, it features an integrated vision unit that supports die inspect and print defects verification. The machine is highly configurable and can be easily integrated with existing test systems. ALESSI Summit 12000 provides automated and self-tuning test measurements, allowing for reliable yield analysis. It is designed for tool integration and includes a RS232 communications interface. CASCADE MICROTECH Summit 12000 is compliant with industry-standard test description languages such as TTCN-3, SPECCTRA, and ARTIST. Summit 12000 is an extremely advanced and high-performance ATE prober designed for automated manufacturing test and burn-in applications. With its large variety of features and options, it is ideal for high-throughput production test and quality monitoring applications. It is engineered for superior test quality and fast test times, providing consistent, accurate, and repeatable measurements for reliable yield analysis.