Used CASCADE MICROTECH / ALESSI Summit 12000 #9228668 for sale

CASCADE MICROTECH / ALESSI Summit 12000 is a prober designed for use in industrial fabrication processes. It is suitable for applications such as laser diode current probing, optical detector characterization, impedance probing and measurement, parametric testing, and electrical characterization. The prober can be used in conjunction with Cascades's Delta Wafer Probing System or other probe systems. ALESSI Summit 12000 is a precision prober that can provide a high degree of accuracy and repeatability when measuring device characteristics. CASCADE MICROTECH Summit 12000 features a 12-inch wafer and is equipped with a flexible state-of-the-art probing platform that is capable of operating in both the vertical and horizontal directions, as well as providing instant access to both near-field and far-field probing capabilities. The prober also features a 5-axis motion resolution for superior placement control, a high-resolution thermal control system for test temperature optimization, and the ability to measure multiple structures in a single operation. The prober has many advantages over other probers, including its ability to operate without the need for external fixtures or measurements. This helps to reduce fabrications setup costs and time. The prober also comes with an advanced calibration system that can be automated with the help of a computer and is designed to reduce measurement errors while increasing the accuracy and repeatability of results. The prober can also be used to analyze device characteristics with differential and thermocouple probes. It offers a wide frequency range and is capable of measuring capacitance, resistance, and inductance. It is also designed to measure current and voltage over both large and small timescales, up to 1.5 ohms with frequency resolution up to 12kHz. Summit 12000 is a reliable and accurate all-in-one measuring solution for industrial fabrication processes. It can be used to measure device characteristics with exceptional accuracy and repeatability, reduce setup costs and time, as well as provide the ability to measure various structures in a single operation. It is ideal for optical detector characterization, electrical characterization, impedance probing, and parametric testing.