Used CASCADE MICROTECH / ALESSI Summit 12000 #9266768 for sale
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ID: 9266768
Semi-automatic wafer prober
Ambient / Hot thermal
Hot / Cold thermal chuck
Micro-chamber
Femtoguard
Thermal wafer chuck, 8"
TEMPTRONIC Thermal
Tri-axial wafer chuck (Ni)
TEMPTRONIC TPO 3000-2300-1 Thermal controller / Chiller
Temperature range: -50°C - 200°C
System controller:
Rack-mount computer, 19"
Operating system: Windows
MITUTOYO FS-70 Microscope / A-Zoom microscope
With trinocular head
Brightfield illumination (Co-axial)
Eye pieces lens: 10x
Objective lens: MPlan APO 20x
Optics bridge mount:
X-Axis movement range, 2" (± 1" from center of travel)
Y-Axis movement range, 2" (± 1" from center of travel)
Pneumatic tilt back Z-lift
Vacuum connection panels
With 10-vacuum ports
Top hat assembly
Flat panel computer monitor
No manipulator
Power: 115V, 60Hz, Single phase, 20 Amps.
CASCADE MICROTECH / ALESSI Summit 12000 is a prober which has been developed to offer semiconductor engineers and technicians outstanding performance as they probe complex devices on wafers or other substrates. Its features include a digitally-controlled dual scan transducer equipment and a large Z-axis range of 12 mm that can accommodate probing substrates up to 330 mm in diameter. ALESSI Summit 12000 comes with a powerful controller that provides several advantages that are essential for gauging and monitoring device-level performance during probe testing. With its high-resolution measurement system, the prober detects most minute changes in resistance or capacitance and can accurately monitor even the slightest fluctuations in temperature. It also features advanced analysis and diagnostics software that can identify any out-of-normal readings and even predict future performance levels. CASCADE MICROTECH Summit 12000 boasts of additional features that enable it to deliver reliable results. For instance, its internal chip-frequency compensation unit compensates for frequency drift in the measurement process, ensuring that users receive consistent, accurate results. It also features a pin-lift mechanism which allows users to lift one or more pins from the substrate without lifting too much from the other pins. The prober also comes with the property of pin side control and pin separation for more precision and cleaner data. Summit 12000 is easy to use and requires minimal operator interaction during testing. It also comes with a simple and intuitive graphical user interface that simplifies the entire process. The device's advanced setup and calibration features allow users to set up repeatable test sequences and calibrate the machine to match a device's characteristics as well as the environment in which it is being tested. The developer, ALESSI, has established itself as a leader in the semiconductor industry. Its long-term commitment to research and development has made the company one of the most trusted names when it comes to testing and inspecting substrates. In addition, the company's support services and customer support team are available for technical assistance when needed.
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