Used CASCADE MICROTECH / ALESSI Summit 12000B-HS #9313345 for sale

CASCADE MICROTECH / ALESSI Summit 12000B-HS prober is a precision measurement instrument designed for automated electrical device testing. This fully automated, multi-channel scanning prober is capable of handling both large and small wafers (up to 300mm) for a wide range of sampling sizes. It is used for measuring wafer resistance, capacitance, inductance, and other signals over large areas, as well as small areas, which requires extremely high accuracy. The prober has a maximum X-Y stage travel range of 12" (300mm), which allows for precise adjustment of multiple probing sites on a wafer, as well as the ability to handle maximum PCB sizes up to 12". The mechanical assembly of ALESSI Summit 12000B-HS is equipped with a 0.5µm step resolution galvanometer-based positioning, with repeatability of 0.02µm. This system has built-in vibration isolation capability, enabling resolutions of up to 50µm to be achieved, even in harsh environments. In addition, the probe head has an innovative design that enables it to perform rapid, repeatable placement of probes. Using a combination of motion control, timing, and precision location tracking, each probe can be put into position with an accuracy of ± 0.001" (2.5µm). The probe head is equipped with an adjustable spring-loaded tip holder for precise and rapid placement of both active and passive probes, as well as AC/DC signal coupling. This system also features an active vibration cancellation system, allowing for further accuracy when contact is made. When it comes to testing, CASCADE MICROTECH Summit 12000B-HS utilizes industry-leading software and hardware components to provide the highest resolution and accuracy for signal characterization. It is designed with flexibility in mind, allowing users to choose from a variety of testing parameters and measurement modes, including both point-to-point and scan measurements. High-speed data acquisition is also available, allowing for up to 40,000 samples per second. Ideal for advanced prototyping and production testing, Summit 12000B-HS prober is a reliable, high-precision instrument that is capable of delivering accurate results in a variety of settings. With its intuitive interface and comprehensive testing parameters, this prober offers a comprehensive solution for a wide range of wafer probing applications.