Used CASCADE MICROTECH / ALESSI Summit 12000B-M #9402806 for sale

CASCADE MICROTECH / ALESSI Summit 12000B-M is an advanced prober designed to meet the requirements of the semiconductor production process. The prober is engineered for a wide range of wafer testing applications, from wafer characterization and process characterization to failure analysis and yield enhancement. The prober features an advanced touch-trigger mechanism that enables accurate and repeatable probing with fine resolution. With its high accuracy and repeatability, the prober offers excellent throughput and yield. ALESSI Summit 12000B-M prober has a modular design that supports both manual probe cards and cassette-loaded Probe Cards. The prober also has a user-friendly LCD display with multiple create, print and recall facilities, allowing users to quickly upload probe cards and make necessary adjustments to the probing parameters. The prober can be used with a wide range of wafer sizes, ranging from 8'' wafers up to 200 mm wafers. It also has a 'Stand Alone' capability that allows users to run pre-defined tests without the need of a host computer. The mechanized part of the prober is made from high grade aluminum and stainless steel and is mounted on a four-degree slide mount for stability and vibration control. The control system of the prober includes a personal computer (PC) with a graphical user interface (GUI). The PC is mounted on an isolator platform that minimizes the adverse effects of acoustic noise from the floor and other sources. The computer is equipped with a real-time operating system, along with multiple communication ports for PC-to-PC communication, Ethernet, and Remote Operation via the Internet. The prober comes equipped with a pressure management system which ensures repeatable pressure control, making it suitable for sensitive probing applications. The prober also has a 'Test Area Set Up' function which facilitates easy one-key optimization of test parameters. The prober is designed to provide high throughput and yield and is compliant with environmental requirements. It has been designed with an Extended Self-Test (EST) feature that continually monitors the prober and notifies users of any problems. The prober also has a modular construction that enables users to modify or upgrade the prober to meet future requirements.