Used CASCADE MICROTECH / ALESSI Summit 12561B #9227359 for sale

CASCADE MICROTECH / ALESSI Summit 12561B platform is a versatile prober designed for efficient contact probing of commercial-off-the-shelf devices. It utilizes a unique combination of technologies from both ALESSI and CASCADE MICROTECH to provide a unique platform that offers rapid throughput, excellent accuracy, and an intuitive user interface. The equipment consists of a mainframe system, with up to two MicroChamber 12MP prober modules connected to it, giving the user the flexibility to probe multiple devices in one session. The MicroChamber technology is based on an advanced electrostatic drive unit coupled with micron-precision motion for high throughput probing with 3-5 micron accuracy. The machine can accommodate different prober configurations, including multiplexer/demultiplexer systems and high voltage probing, as well as probe cards and jigs. The prober platform also incorporates several other features to facilitate efficient testing, including an onboard camera for alignment and changeover, multiple direct interface inputs and outputs, and a highly flexible and adjustable heating tool. The level of control over different aspects of the test environment makes the platform particularly suitable for testing of MEMS and RF devices, as well as power device testing. Finally, ALESSI Summit 12561B asset comes with an intuitive user interface, allowing easy access to automated probing recipes and strategies, as well as providing clear graphical feedback for all test results and commands. This intuitive interface has been designed to have minimal impact on the user's workflow and time to product design. Additionally, the model has an integrated API that enables it to run remote programs and scripts, increasing its usability and triggering data from third-party systems. CASCADE MICROTECH Summit 12561B platform is an excellent choice for commercial-off-the-shelf device testing, offering high accuracy and throughput, an intuitive user interface, and the flexibility to adapt to different prober configurations. All these features combine to make it an essential tool for the effective testing of MEMS and RF devices.