Used CASCADE MICROTECH / ALESSI Summit 9000 #9259829 for sale

CASCADE MICROTECH / ALESSI Summit 9000 prober is a versatile wafer probing solution that is designed to provide automated and repeatable testing of wafer-scale products. It is equipped with an automated vision and alignment equipment, high-precision wafer probes, advanced software, and powerful test capabilities. This system is capable of testing up to 256 probes at a time, making it ideal for large production runs. The unit has a highly programmable control machine that can be programmed for various applications such as wafer characterization, quality assurance, fault-isolation, and diagnostics. The tool utilizes pattern-matching algorithms that enable it to accurately monitor the test results and verify that no errors have occurred. The prober also features a host of automated measurement and data analysis capabilities. ALESSI Summit 9000 has a robust vacuum hold-down asset, allowing the model to take high-precision samples with minimal strain or damage to the sample. This equipment is fully capable of testing multiple probes at the same time, allowing faster testing rates than manually operated systems. In addition, CASCADE MICROTECH Summit 9000 utilizes ALESSI proprietary control language for programming and provides complete traceability of results in a variety of formats. This allows for precise calibration, repeatable testing, and optimization of existing processes for maximum efficiency and cost savings. Summit 9000 also features a variety of safety features, including an industry-leading Electrostatic Discharge (ESD) protection system and a high-contrast vision unit for accurate alignment and sample positioning. This machine can also be easily integrated into a larger automated or semi-automated facility, allowing for rapid implementation of the prober into existing procedures. Overall, CASCADE MICROTECH / ALESSI Summit 9000 prober is a powerful, versatile testing solution that provides reliability, repeatability, and advanced capabilities in a compact design. With its multiple probe capabilities, automated features, and integrated safety features, it is an ideal choice for wafer-scale testing.