Used DVT SOLUTION Gigaprobe DVT30-1MM #102353 for sale
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ID: 102353
Hand held probe for TEKTRONIX TDR oscilloscopes
30GHz, Differential & Single-end, 0.25~2mm pitch adjustable
Used for: TDR/TDT, S-parameter
Features:
30 GHz Bandwidth
True Odd Mode 100 ohm Differential Input Impedance
Probe can be converted to 50 ohm input impedance
TDR Launch Discontinuity <20 mv
Fall Time 20 ps or <5 ps Fall Time Degradation
Fully Balanced Differential Signals without Ground Contact
Adjustable Probe Pitch from 0.25 mm to 2.0 mm
Probe Tip diameter 0.254 mm
Gold Plated Conductive Diamond non oxidizing probe tips for
repeatable TDR measurements
Low probing force <10 grams
Four probes in one: Use as a 100 ohm, 50 ohm, as a Hand Probe or
Mount in a probe articulating arm for hands free probing
Full Set of Probe Pitch Calibration Accessories Included
Characteristics:
Attenuation: 1X
Probe Only Bandwidth: 30 GHz
TDR Degradation: <5 ps
Probe Pitch: 0.25 mm to 2.0 mm (signal tip to signal tip)
Connector Type: SMA
Measured Reflected TDR Fall Time: 20 ps
Impedance: 100 differential, 50 common mode,
Max Voltage In: 5.0 V
(Note: numeric values shown are typical)
Applications:
Create - Single Ended, Differential Insertion, Return Loss Sparameters
from TDR/ TDT Measurements for determining interconnect
bandwidth performance using Tektronix DSA8200 TDR and IConnect®
Impedance Testing - Use IConnect for precision impedance analysis
of IC Packages, Cables, PCB’s and Backplane Testing
Failure Analysis of Device Packages - Locate failure modes.
DVT SOLUTION Gigaprobe DVT30-1MM is an advanced semiconductor probing device designed to provide industry-leading accuracy and speed when testing and measuring the performance of semiconductor materials. The unit incorporates an array of high-precision probes that feature an ultra-low-noise design, enabling users to accurately measure electrical signals from the smallest of circuits. The device features a compact, ergonomic design with a long and stable platform for efficient testing. The adjustable spindle mount allows for easy positioning to quickly access and accurately target test components, allowing for faster probing and better performance. The platform also allows for quick alignment and front of the unit access, which helps reduce contamination from outside contaminants. The probe-heads are designed to provide a powerful yet quiet operation, minimizing heat and noise during data acquisition. The probes feature an independent ground return for simplified shield-signal probing and an internal heating function ensuring high consistency with accurate readings. The removable sample handling arms provide fast sample loading and unloading, creating an efficient testing solution. Gigaprobe DVT30-1MM also offers automated contact recognition with four user-selectable contact force levels and a dynamic automated reference check, ensuring that each contact is properly tested. Additionally, the measurement cycle time can be maximized with a feedback-based voltage limit setting and automated contactless testing with a multi-voltage probe. Overall, DVT SOLUTION Gigaprobe DVT30-1MM is an innovative, efficient and powerful prober designed to tackle the toughest semiconductor testing needs. Its advanced features, reliable performance and high-speed data acquisition make it an ideal choice for labs and semiconductor testing professionals looking for a reliable and accurate probing solution.
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