Used DYMATIX 821077-012 #293815522 for sale

DYMATIX 680E is a prober engineered for the semiconductor industry for the testing of integrated circuits (ICs). It is a multi-function prober for quality control, product qualification, R&D, and process development applications. 680E prober is equipped with an automated, high-resolution, motorized, 6-axis motion system designed to meet the requirements for nanometer-scale testing accuracy. The system allows for differential heat control between the sample probe (S-probe) and contact probe (C-probe), which enables better isolation of thermal drift and improved accuracy when testing low-k samples and ultra-thin metallization layers. DYMATIX 680E prober also features a high-precision, low-noise drive, low-noise amplification, and noise-reducing technologies to ensure excellent thermal stability and signal-to-noise ratio. This enables reliable test results even with ICs of various sizes and contact designs. The prober supports multiple stages to accommodate various sample sizes and automation configurations. It also supports multi-site testing and utilizes interchangeable wafer stages, so tests can be quickly and easily resumed even if sample sizes or pads change. 680E is designed to support a range of test applications, including thermal characterization, DC and RF probing, AC probing, transient analysis, LEAK test, delay testing, and more. It comes with an intuitive user interface that allows users to quickly set up tests and monitor results. DYMATIX 680E is also equipped with advanced safety features that protect both the operator and the prober from electric leak or current faults. In addition, it is designed to meet industry-leading performance standards for energy efficiency, electromagnetic interference (EMI) and radio frequency interference (RFI) immunity, temperature, humidity, sand and dust protection, shock and vibration protection, and more. Overall, 680E is a reliable and versatile prober with features that ensure excellent accuracy, speed, and repeatability. It is well-suited to a wide range of semiconductor applications and industries, making it an ideal choice for both quality control and research and development testing.