Used ELECTROGLAS 2001 #158684 for sale

ELECTROGLAS 2001 is an advanced prober for probing and testing semiconductor devices. This is an advanced prober that offers a wide range of electrical, optical, and mechanical testing capabilities for advanced semiconductor applications. This prober features powerful software that is user-friendly and includes a variety of probe configuration options, with an intuitive graphical user interface and support for a broad range of complex device testing requirements. This prober is capable of handling high pin-count devices, multiple probes, and simultaneous device testing. This can enable high throughput and improved yield for advanced device processes. 2001 uses a variety of probes for testing transistors, diodes, and other semiconductor devices. These probes are designed to provide a reliable and accurate contact to the device surface and to ensure that adequate electrical measurements and signal integrity are achieved. Probes are typically selected based on the device type, pinout, and device parameters. ELECTROGLAS 2001 also features a number of advanced testing options, such as current and voltage source and measurement, environmental testing, and a wide range of voltage and current conditioning. This allows semiconductor engineers to perform a broad range of advanced electrical tests and to accurately quantify the device characteristics. Additionally, this prober is equipped with specialized statistical probes, which allow for analysis of the fail rates for test batches, for advanced binning and to improve process yields. 2001 is compatible with the latest CAD systems, allowing for automated and efficient control over the prober movements. This offers the potential for significant time savings, as well as improved accuracy and reliability. Engineers can also benefit from the ability to quickly modify test conditions, as well as from support for a number of specialized device testing functions. ELECTROGLAS 2001 is an ideal prober for today's advanced semiconductor applications, with powerful and reliable tools for testing a variety of semiconductor devices, as well as an array of advanced device testing functions and capabilities. With 2001, semiconductor engineers can ensure accurate and reliable testing results and improved yields.