Used ELECTROGLAS 2001 #9023681 for sale

ELECTROGLAS 2001 is a high‐performance semiconductor wafer prober designed for use in failure analysis, process development, and production testing. This advanced wafer prober from ELECTROGLAS combines speed, accuracy, and reliability to provide exceptional wafer handling capabilities. 2001 has a number of features that make it well-suited for use in semiconductor failure analysis and wafer probing. The prober features a six-inch sample-handling enclosure with an integrated vacuum wafer chucking equipment for standard 4- and 6-inch sample substrates and can handle up to twenty wafers at a time. In addition, it features a closed-loop XY motion system, allowing for high-speed scanning up to 2300 mm/sec. This advanced feature, combined with a standard 0.5 μm resolution, allows for highly accurate precision probing of wafers. ELECTROGLAS 2001 is further equipped with an independent Z-axis motion unit with a vertical range of ±12 mm for larger packages, as well as a 45-degree motion range for tilted probes. It also features the ability to store up to 1000 recipes for various probing strategies, as well as an adjustable probe gap to allow for higher accuracy in sample probing. The prober's advanced motor control machine also provides precise programmable current limiting and speed control for all axes. 2001 has been designed with advanced safety features, such as a collision detection tool that automatically stops the prober when it hits an obstacle. In addition, the asset's open architecture allows for easy updating and maintenance, allowing for improved reliability and performance. Overall, ELECTROGLAS 2001 is a powerful and reliable semiconductor wafer prober that provides quick and accurate probing of wafer samples. It is well-suited for applications requiring highly accurate, high-speed probing and is ideal for failure analysis, process development, and production testing.