Used ELECTROGLAS 2001 #9173719 for sale

ELECTROGLAS 2001 is a high performance computerized prober manufactured by ELECTROGLAS, Inc since 1981. It is a full-featured, multi-purpose prober that offers a comprehensive range of testing and probing capabilities. It can be used to characterize a variety of substrates, including wafers, chips, and printed circuit boards. 2001 is designed with a whole suite of features to provide robust and reliable prober performance. To start, ELECTROGLAS 2001 offers a full 4-axis computerized motion control with a maximum step size of 50 microns. This enables the equipment to rapidly and accurately probe the substrate in a consistent manner. Other features of the motion control include a high resolution encoder for traceability and a 40 microsecond response time. 2001 also includes a fully programmable automation system. This provides the operator with a way to quickly and accurately position test probes to any point on the substrate and reduce the time required for manual setup. This automation unit can also be used to program and execute various test sequences or establish test patterns. ELECTROGLAS 2001 is capable of testing a variety of substrate materials, including 2-layer FR4, Kapton, and silicon substrates. It also allows for testing of both through-hole and surface mount components with a variety of different probe types. In addition, it is capable of providing fast, reliable probing and testing at 16 individual test points and can accommodate a variety of different test media, including IC, PTFT, socket and UUT. 2001 is a reliable and productive prober that offers a wide range of features and capabilities. It is designed to provide high accuracy and repeatability, which is essential for reliable testing and measurement of electrical properties. The machine's advanced 4-axis motion control and programmable automation tool allow it to probe and test with accuracy and speed. This makes it an ideal choice for automated testing and probing of a variety of different substrates in various test and measurement applications.