Used ELECTROGLAS 2001 #9174788 for sale

ELECTROGLAS 2001 is a multi-purpose prober that has been designed and manufactured by ELECTROGLAS specializing in the testing and probing of advanced integrated circuit devices. The device offers precise and repeatable measurements with superior accuracy, and is also suitable for use in both production and development environments. It offers users a clear view of the device being tested, with consistent probing accuracy, and precise alignment in Z and X axis directions. The prober is equipped with a sophisticated probing equipment that performs both electrical and physical probing at the same time. The probing system is capable of measuring the electrical characteristics of the device, as well as any physical defects such as die layout irregularities. The unit also offers an extensive range of probing options, including bulk, stacked, and dense array probing. 2001 is also equipped with an auto-calibration function, allowing the user to quickly and accurately adjust the electrical characteristics of the probe tip, such as resistance, capacitance, and voltage. This ensures the user always obtains precise and repeatable results. The calibrations are performed quickly and accurately, with virtually no delay in the data acquisition. The prober includes an integrated vision machine which offers precise alignment over a specified area. This allows the probe to accurately align over the device within seconds. The tool is also equipped with a quantitative "cross-section algorithm" which is used to calculate the depth of each measuring point. This reduces the risk of possible collisions between automatic and manual mode of operation. In addition to the integrated vision asset, ELECTROGLAS 2001 also supports a wide variety of active and passive probing methodologies. The device is capable of active, passive, and force sensing probing. Active probing requires the device to apply a voltage across the test contacts, thus allowing users to measure device electrical parameters. The device also supports passive probing which measures current or voltage values without applying additional voltage. Lastly, force sensing allows users to measure the force applied to the device at selected points, allowing for a comprehensive analysis of the device. All these features enable 2001 to provide a comprehensive, accurate, and repeatable testing experience that meets the highest standards.