Used ELECTROGLAS 2001 #9316111 for sale

ELECTROGLAS 2001 is a precision prober for semiconductor wafers. The prober works by using electromagnetic field styli to measure the electrical characteristics of components on the semiconductor wafer. The prober is equipped with two Ion Beam Sources (IBS), for measuring the electrical potential and field components of samples. The prober has a variety of applications, including but not limited to measuring parameters such as threshold voltage, contact resistance, DC current, frequency response, capacitive probe tests, and leakage current tests. 2001 utilizes an advanced X-Y stage to position the wafer in the proper alignment for precise measurements. The prober also has an Auto System Alignment for easy re-alignment of the wafer. ELECTROGLAS 2001 has a range of scripting tools for creating test programs and can also be programmed for individual unique tests. The prober has a built-in level control system which maintains a different level of voltage across the electrode plates while testing. This ensures that the electrodes are clean and free from any potential contamination during testing. Furthermore, the prober can be operated remotely with the supplied software suite, allowing for greater control and convenience. The prober is also equipped with safety features such as a grounded test shield, operator interlock, and anti-static protection. Designed with high precision accuracy and reliability in mind, 2001 is a powerful tool for measuring the electrical characteristics of various types of components on semiconductor wafers. With its advanced testing capabilities and customizable abilities ELECTROGLAS 2001 is an excellent choice for device measurement and testing.