Used ELECTROGLAS 2001 #9372651 for sale

ELECTROGLAS 2001 is a cutting edge semiconductor prober that is frequently used in the semiconductor manufacturing industry. This prober is designed to accurately measure and test various properties of semiconductor wafers, including their electrical characteristics and defect tolerant performance. Additionally, 2001 is an invaluable tool for accurately analyzing and sorting semiconductor wafers. ELECTROGLAS 2001 has two main components: a prober head and a wafer mapping station. The prober head allows technicians to move a needle onto the surface of a wafer to take measurements. This setup is both accurate and repeatable, providing technicians with accurate measurements while avoiding errors associated with manual measurements. The prober head is also extremely durable, allowing it to be used in harsh industrial environments. The wafer mapping station is used to map the surface of wafers, helping technicians determine physical defects and their location on a given wafer. This station incorporates advanced algorithm technology that allows for readings to be taken at multiple points at once, providing a high level of accuracy and repeatability. The wafer mapping station also provides a 3D visualization of the wafer surface, allowing technicians to see potential defects with greater clarity. Overall, 2001 is a versatile and reliable prober for use in the semiconductor industry. Its prober head and wafer mapping station provide fast, accurate measurements and visualizations that are critical for the successful operation of semiconductor facilities. The robust construction of ELECTROGLAS 2001 ensures reliable operation in the most demanding industrial environments. 2001 prober is a must-have tool for anyone looking to analyze and sort semiconductor wafers.