Used ELECTROGLAS 2001 #9372657 for sale

ELECTROGLAS 2001 prober is a high-performance, low-frequency modular prober equipment with an expanded feature set and full-fledged integrated measuring board for advanced wafer probing. The system is capable of testing DC, AC, and Mixed-Signal technologies, as well as offering a unique solution for probing through pad arrays that were designed with High Density Interconnects (HDI) in mind. 2001 prober is designed to meet the stringent probing requirements that are needed for circuit board testing in a variety of industries, including electronic design automation (EDA), semiconductor manufacturing, automotive, medical, telecommunications, and aerospace. ELECTROGLAS 2001 prober utilizes the latest technologies and components, such as its proprietary lower voltage, higher accuracy, nano-volt-meter measurement board to ensure accuracy and precision in device testing. The board includes a 1000V DC power supply for measuring high power devices, an adjustable 0-1 amp current source, two virtual channel voltmeters for AC and DC voltage measurements, and four dual channel digital signal processing-DSP board for I2C and SPI communication. 2001 prober also features a two-stage electrical testing process to ensure the highest accuracy of component testing. The first stage involves a base current probing up to 1,000 volts, while the second stage is a double current injection probing at 40 kHz, 2 kHz, and 0.5 kHz, respectively. This two-stage testing process helps to ensure a higher degree of accuracy and reliability in testing components, even in the presence of delays and timeouts caused by different media types. ELECTROGLAS 2001 prober also offers an automated base test setup for quick parameter setup. This setup feature is especially useful when measuring low frequency signals, which require more precise measurements. Furthermore, the automated setup eliminates the need for manual testing, increasing overall operating efficiency. 2001 prober is equipped with advanced thermal management capabilities that are capable of managing up to three isothermal test systems. This allows multiple testing configurations to be performed simultaneously, significantly reducing the time needed for the entire testing process. Additionally, the thermal management feature also ensures that the test results are repeatable, as the unit can be operated under identical conditions each time. ELECTROGLAS 2001 prober is an advanced wafer probe machine that is capable of measuring DC, AC, and Mixed-Signal circuits with pinpoint accuracy. The tool utilizes cutting-edge technologies to ensure the highest degree of reliability, accuracy, and efficiency in testing components. Moreover, the automated setup and thermal management features make 2001 prober an ideal choice for high-frequency component testing.