Used ELECTROGLAS 2001CXA #9155193 for sale

ELECTROGLAS 2001CXA is a powerful automated prober designed to handle a wide range of materials in a variety of probing applications. The prober is powered by a precise, high-speed, and repeatable positioning equipment that ensures precise measurement of different materials to enable efficient manufacturing processes. 2001CXA features a high-speed, single-axis automated positioner that can move with linear (X/Y/Z) or angular (XY/YZ) motion, allowing for low-force force and high-precision alignment between the sample and the probe. It also has a high precision single plane alignment system, which automatically recognizes sample height, pitch and roll to ensure precise probe alignment. Additionally, it has a flexible range measuring unit (FRMS) that can select from a wide range of Z-axis increments from 1mm to 6mm. ELECTROGLAS 2001CXA also boasts an advanced probing machine that features an integrated scanning tool for position, pitch, roll and dynamic compliance measurements. This asset allows for accurate measurement of the height and pitch of microelectronic components and features an intelligent model for thermal control that prevents contact force errors and thermal damage. To ensure fast, accurate automated positioning of components, 2001CXA has a 320 waveguide scanning head that enables faster speed, higher accuracy and higher sampling rates. This fast, high-precision scanner is integrated with an extensive set of programs and controls to facilitate reliable, repeatable results. ELECTROGLAS 2001CXA also comes with a selection of non-contact sensors, including capacitive and pneumatic, to enable measurement of surface characteristics, such as height, pitch, roll, resistance and stress. Additionally, ELECTROGLAS offers a range of software packages that maximize advantage to ensure accurate and repeatable automated testing and measuring. These features make 2001CXA an ideal choice for a wide range of automated probing applications, such as wafer probing, yield enhancement, and further production measurements.