Used ELECTROGLAS 2001XA #293589565 for sale

ELECTROGLAS 2001XA prober is a full-featured, advanced auto-probing system designed for a wide range of semiconductor testing and probing applications. It offers precision automated control for accurate and repeatable measurements, providing reliable and cost-effective die and wafer probing solutions. This prober combines high-speed scanning, advanced motion control, and sophisticated circuitry to ensure high yields and test accuracies. 2001XA features a programmable electromechanical actuator that allows precise, automated X-Y and orientation positioning of the component die, with a scanning speed of up to 50mm per second and a resolution of 1-2 micrometers. Its unique electromechanical design delivers a smooth linear motion in both directions, eliminating mechanical vibrations and any potential interference with the device under test. The robust architecture also avoids issues such as 'coupling' due to vibrations, making it ideal for high-precision measurement applications. In addition, ELECTROGLAS 2001XA also offers advanced probing capabilities, with fast probing speeds up to 200MHz in synchronous operation and 500MHz asynchronous speeds for a variety of options related to measuring contact closes and open capacitance. Its powerful software suite also enables users to create complex probing patterns in a well-defined layout, providing options for a variety of critical probing solutions. 2001XA also has integrated wafer mapping and inspection capabilities, allowing users to test a variety of devices without leaving the system. The prober also offers an ergonomic design, making it comfortable and easily accessible, while its modular build technology offers easy integration with other test and measurement solutions. Overall, ELECTROGLAS 2001XA provides an efficient and reliable testing solution, supporting advanced probing and wafer mapping applications. It is highly accurate and cost-effective, offering businesses a fast and reliable solution for accurate die probing and wafer testing.