Used ELECTROGLAS 2001XA #293592412 for sale

ELECTROGLAS 2001XA is a high-end semiconductor prober designed for failure analysis, device characterization and testing, and product development. It provides a wide range of advanced capabilities to enable accurate and efficient technology probing. 2001XA employs a robust and dynamic equipment architecture to ensure precise wafer and device probing. An advanced, high-performance scanning system incorporates a variety of alignment methods and closed loop, real-time feedback to ensure accurate wafer positioning relative to the probe tips. Laser align, vision align, and fiducial alignment processes can all be utilized to ensure a precise final alignment. Precision kinematics incorporated within the unit allows high-speed autoscans and extended probe coverage across a 6-inch/150 mm wafer. ELECTROGLAS 2001XA employs a proven probing machine to provide integrated wafer-level probing up to 200 MHz with accuracy better than ±10 microns, 1 to 15 micron lift heights and repeatability of ± 0.25 microns. The prober also includes precise temperature control functions to ensure precise temperature stability across wafers up to 10-inch/250 mm. The probe station also includes advanced function test options, including a precise and efficient test standby function, an ambient temperature function to study device stability at various temperatures, a timing window function to accurately measure data transitions at high speed, and even a fault-scan function to quickly and comprehensively analyze devices for electrical and performance faults. 2001XA is designed for optimal ergonomics and usability, as well. Its intuitive user interface allows for quick setup and programming, as well as easy operator guidance. Various setup configurations are available for different levels of user experience and expertise, from the entry-level to the advanced user. Overall, ELECTROGLAS 2001XA provides precise and reliable performance, combined with intuitive operation and comprehensive test functions to enable maximum productivity and reliability in the probing and testing of semiconductor devices. It offers the perfect solution for high-quality probing and testing in the technology lifecycle.