Used ELECTROGLAS 2001XA #293592413 for sale

Manufacturer
ELECTROGLAS
Model
2001XA
ID: 293592413
Prober.
ELECTROGLAS 2001XA prober is a high-performance tool commonly used in the semiconductor testing and product development industry. This tool is capable of both full-wafer probing and specific-die probing. It uses a single-head, high-speed manual prober with a precision linear drive and a patented high-power scan-detection circuit to facilitate electrical stimulation, testing and analysis. 2001XA features a dynamic scan detection and capable of a flexible recipe development environment. It also features precision linear drive, a high-resolution X-Y stage, built-in power monitoring, and comprehensive data analysis which includes profile, sigma and delta measurement capabilities. The prober is capable of probing analog, digital and mixed-signal devices from 200 mm to 300mm wafers, flex circuits, MEM and MCM packages. Users can employ ELECTROGLAS 2001XA for various applications, including burn-in testing, device characterization and specification testing, bit error rate testing, static and dynamic logic testing, high-frequency measurements, and parametric checks. The prober is equipped with a high-resolution XY stage, allowing for accurate placement of small patterns. It also utilizes a patented scan detector circuit for early indications of fast current and voltage drivers. This is advantageous for devices that require scans faster than the probe's speed. 2001XA also features on-board data management software integrated into its user interface, allowing users to access stored data quickly. The equipment is constructed with a top-of-the-line design, featuring a durable graphite base, which is resistant to vibration and movement. To further ensure system stability, ELECTROGLAS 2001XA prober utilizes a high-precision linear drive, a low center of gravity, and a low profile height. 2001XA is designed to reduce wafer probing time and increase test efficiency. Its height adjustable mechanism allows for greater ease of testing between various wafers and packages. The prober also comes with a thermal management unit that ensures peak performance, by providing forced-air circulation and high-flow thermal sensors to maximize performance. ELECTROGLAS 2001XA is a superior machine equipped with a variety of features and capabilities, ensuring greater accuracy and better test performance. Its high-end design caters to a wide variety of semiconductor testing applications and device testing, making it an ideal choice for wafer probing.
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