Used ELECTROGLAS 2001XA #9170435 for sale

ELECTROGLAS 2001XA Prober is an advanced semiconductor wafer probing equipment capable of probing up to 300mm semiconductor wafers. Built on the robust 2001X platform, 2001XA includes advanced diagnostics, software and probing capabilities, making it an ideal choice for chip manufacturers dealing with smaller wafers and higher die counts. ELECTROGLAS 2001XA features both an electrical and a physical probing arm, allowing users to accurately position and contact individual dies on the wafer before triggering electrical measurements. The advanced design of 2001XA further allows two types of probes to be used - contact and non-contact. Contact probing allows the analysis of physical characteristics of the die, such as die thickness, through the use of specialized probes. Non-contact probing allows for electrical characterization of the wafer's circuit. ELECTROGLAS 2001XA Prober offers the industry's leading repeatability and accuracy in probing large wafers. It is also designed and built for scalability and ease-of-use. 2001XA's Probe Control Software (PCS) allows users to quickly switch between wafers and die sizes, as well as maintain tight control over the probing process itself. ELECTROGLAS 2001XA is also compatible with 2001XA-U Vacuum Chucking System, allowing for direct vacuum contact of the wafer during the probing process. This reduces the chance of wafer breakage during the probing process and ensures higher quality results. ELECTROGLAS 2001XA boasts a wide range of diagnostic capabilities. The advanced mixed-signal diagnostics put it on a higher level from most other probers. The unit's high-speed transient memory allows the analysis of over 11 million transient samples per wafer. The optical reflectometry feature detects die surface topology in both 2D and 3D, providing better contact fidelity. 2001XA's advanced algorithms also detect parameter mismatch from die to die and circuit performance on a wafer level. In summary, ELECTROGLAS 2001XA Prober is an advanced machine designed for testing and probing semiconductor wafers. It offers advanced features and built-in diagnostics. It also has excellent scalability and is designed for ease of use.