Used ELECTROGLAS 2010CX #9236746 for sale

ELECTROGLAS 2010CX is a 20 Mil capacitance type wafer prober that is designed to measure the parameters of semiconductor devices. It is an advanced and efficient testing equipment that is able to accurately measure capacitor thickness and leakage, as well as testing for capacitance matching and device contrast. 2010CX is designed for use with high value, ultra-thin gate oxide technologies. It is designed to ensure accurate capacitance measurements of very small areas. It works by sending out a signal and then receiving an indication of capacitance level. The system is equipped with a state-of-the-art signal conditioning and analysis module that is capable of directly detecting conductive gate leakage. The unit features an open architecture and an easy-to-use graphical interface. It requires six steps to initiate the test and five steps to analyze the measurement results. The machine is also integrated with an automated load board handling tool that allows for efficient loading and unloading of devices. The asset is capable of testing to resolutions as small as 1 femtoFarad and to accuracy of 1%. ELECTROGLAS 2010CX is an ideal tool for wafer probers and testing engineers. It has the capability to quickly identify subtle shifts in capacitance levels that may be missed due to process variations in fabrication. The model offers enhanced accuracy, reliability, and ease-of-use, making it a highly efficient and reliable testing equipment for semiconductor devices.