Used ELECTROGLAS 2010CX #9248878 for sale

ELECTROGLAS 2010CX is a highly advanced semiconductor prober that enables ultrafast testing of integrated circuits on advanced wafer substrates such as silicon, gallium arsenide, and other compound semiconductors. With its patented advanced electrostatic drive technology, this equipment has unprecedented testing speeds and accuracy. 2010CX brings added flexibility and performance to the testing process. It comes with an advanced touch screen controller and multi-level access that allows users to quickly configure tests and move between them with ease. The Touch Screen Controller also allows for the configuration of powerful advanced algorithms that can be quickly adjusted to account for test system degradation. This powerful prober boasts advanced XYZ scanning capabilities, allowing testing of multiple chips or patterns on wafer with higher speed and accuracy than ever before. With its XYZ scanning capability, ELECTROGLAS 2010CX can detect open and short circuits and other defects with quick, pinpoint precision. Additionally, 2010CX is capable of chip to universal package compatibility, testing both Bare Die and QFN, CSP and TSOP packages. The unit also offers industry leading speed and accuracy in characterization tests, with high resolution DC, AC and capacitance tests. The advanced prober technology also allows for highly accurate capacitance and inductance measurements at different temperatures. This machine is also equipped with a planarization pump that compensates for processing differences across the wafer surface and improves accuracy of measurements over temperature. In terms of safety, ELECTROGLAS 2010CX includes advanced ESD protection that greatly reduces the risk of ESD damage to the device being tested. Additionally, the tool is compliant with ISO-9000, safety and European Directives and meets EMC (electromagnetic) standards too. In short, it is an ideal prober for testing high-end semiconductor wafers.