Used ELECTROGLAS 2010CX #9292719 for sale
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ELECTROGLAS 2010CX prober is an advanced, multi-functional tool used to measure electrical and physical parameters of electronic devices. It is primarily designed to test semiconductor devices, organic materials, and integrated circuits (ICs). The equipment features a high-speed scanning capacitor and probe head that offer fast probing capability and accurate parameter measurements. The prober also includes a laser alignment system, which ensures precise placement of the probe tip. 2010CX prober can execute 100 to 200 measurements per second and maintains accuracy to within 1 nanosecond. The prober is equipped with an advanced digital processing unit that is capable of performing multiple measurements simultaneously. This allows it to make tests on both device ports at the same time, allowing for more accurate measurements as compared to traditional single-channel systems. The prober also includes a highly sensitive resolution control unit that allows for fine tuning of the probe head alignment, allowing for precise positioning of the probes for accurate measurements. The machine is also equipped with built-in temperature control and temperature compensation sensors, which allow for protection against thermal expansion-based errors. In addition, ELECTROGLAS 2010CX also supports on-the-fly testing, ensuring accurate measurements even when exposed to influences during testing. The prober can be operated from a remote computer or programmed locally using the prober's intuitive graphical-user interface (GUI). The user interface supports various languages, displaying the test scripts and parameters in English, Chinese, and Japanese. 2010CX can be integrated with other test equipment, such as signal generators and oscilloscopes for additional capabilities. Its standard built-in program development environment enables user-defined programs to be easily added to the prober. ELECTROGLAS 2010CX is a robustprober tool that offers excellent performance and accuracy. Its multi-functional design allows for a variety of measurement capabilities and makes it an ideal solution for testing semiconductor devices and integrated circuits. In addition, the asset's intuitive user interface allows for easy customization and programming, providing users with a versatile and powerful testing solution.
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