Used ELECTROGLAS 2010X #132668 for sale

ELECTROGLAS 2010X is a prober that is used in semiconductor engineering and fabrication testing. It is an automatic contact test prober that is used in the production of integrated circuits, wafers, devices, RTD (Radiation Treated Die), and a wide range of other testing processes. This prober is designed to allow for higher throughput rates with precise probing accuracy. 2010X has a cantilever test head which allows for less force being used during testing, increasing the accuracy and reliability of contact testing results. The prober also has an intuitive user-friendly interface, comprised of a graphical user interface (GUI), buttons, rotary switches and jog wheels that allows the user to easily control the prober. The GUI has a library of stored test patterns, offers a variety of features such as imaging capabilities and real-time monitoring of test results. This prober has dual-frequency DC parametric measurement capabilities, providing users with the ability to perform reliable DC tests. It is also equipped with LoFES, which is a low-frequency electrical test system that can be used to detect errors in low-state conditions. Additionally, there is a four-channel single-pin driving test feature that allows users to perform complex test scenarios that require multiple pins to mesh with the same test head. ELECTROGLAS 2010X is PEC (Probing Equipment Check) and SMART (Self-Monitoring and Reporting Technology) compliant, allowing users to easily monitor test results to ensure they are within specified parameters. It has onboard temperature control capabilities, as well as a multi-language control display that can be easily programmed based on user needs. The prober has a robust design, featuring a heavy-duty steel and aluminum frame, which helps to increase its durability and extend its life expectancy. This prober also has a method of reducing electrostatic discharge (ESD) events and a range of high-quality active and passive components that all serve to protect the device from potential damage, contamination, or performance degradation. Overall, 2010X is an extremely reliable, highly accurate, and feature-rich prober that is ideal for conducting high throughput and intricate contact tests in the semiconductor industry. With its superior accuracy and reliability, it is a great choice for anyone who needs reliable test results and high production yields.