Used ELECTROGLAS 2011XPC #9399676 for sale

ELECTROGLAS 2011XPC is a high-performance prober used for the testing of semiconductor devices. It is designed for high-yield contact probing, superior probing performance, and quick data collection. 2011XPC equipment comes with a high-resolution, low-noise probe head, an ergonomic operator input/output (I/O) console, and a targeted system that allows operators to easily access and adjust the machine's operation. ELECTROGLAS 2011XPC probe head contains multiple high-precision, low-noise probes that can be individually configured to contact a specific device pad. Its small size, compared to other probers, allows it to access even the smallest pads. The probe carries a customizable loading unit which both slows and controls the tip bring-up for a more consistent electrical contact between the probe and device contact. 2011XPC I/O console is designed with an ergonomic layout and intuitive software. It allows operators to adjust the probe configuration to test a specific device and diagnose, configure, and adjust probe performance. The software enables the operator to quickly, accurately measure and analyze the test device. ELECTROGLAS 2011XPC Test Targeted machine helps identify the device to be tested, determine the test sequence for the device, and verify that the device has met all quality parameters. This tool also allows the user to access test results quickly and easily. 2011XPC also has advanced features like real-time fault detection, dynamic noise and cross-talk compensation, high-accuracy mapping, and failsafe high voltage isolation. These features improve the accuracy, speed, and reliability of the test asset. Overall, ELECTROGLAS 2011XPC provides users with better performance, higher reliability, and faster automated testing than other probers. Additionally, its ergonomic design, simple software, and intuitive navigation make it easy to use. This makes 2011XPC the perfect choice for any semiconductor device testing.