Used ELECTROGLAS 2080X #6037 for sale

Manufacturer
ELECTROGLAS
Model
2080X
ID: 6037
Prober X-Y Base unit with controller, 8" Ring carrier: RC-2 Gold STD chucktop, 8" OLYMPUS Microscope with lamp Probe card holder PZ-5 Z-stage, .25 mil res LCD Monitor, 15" Keyboard assy Microscope arm assy 768k System memory board Wafer auto load kit, 8" Auto align unit with CCD optic assy Operator control assy Wafer profiler kit Low table.
ELECTROGLAS 2080X is an advanced, fully automated prober designed for high-performance characterization and reliability tests. It offers a wide range of options, including high-speed scanning, multiple axes of motion, precision measurement capabilities, and a variety of software and hardware options. This prober provides high precision, fast data acquisition and high speed scanning, thus enabling accurate, repeatable tests. 2080X features a range of wafer handling, probing, and alignment options to support a wide variety of applications. The wafer stage is designed for the simultaneous handling of multiple wafers, with independent motion available on up to five axes. A rigid, high-force, motorized z-axis ensures accurate distance measurement over the full range of probing requirements. The precision design and miniaturization of the probe arm allow for precise probing and positioning of delicate components. The prober comes equipped with an advanced vision system that provides highly accurate wafer alignment and auto-alignment capabilities. Real-time positional feedback helps optimize probe placement and accuracy, while a real-time vision system provides precise alignment and inspection of device flatness prior to probing. ELECTROGLAS 2080X supports a variety of electrical test architectures, providing both high speed data collection and precision scanning. It is compatible with a wide range of test heads, including multiplexers, contactors, WfDAs, channels, and even AFM/SPM. The prober also incorporates real-time test feedback mechanisms such as failure analysis, traceability, and analysis of yield trends. In addition, 2080X is equipped with a variety of application-specific test options. The software package can be configured for applications such as burn-in, photo metrology, and semiconductor manufacturing. It also supports temperature monitoring, allowing for precise temperature control during high temperature tests. In addition, the prober can be used in automated high-speed probing systems. ELECTROGLAS 2080X prober from ELECTROGLAS provides high-performance, reliable testing and precise data acquisition. Its wafer handling, probing, and alignment options make this a versatile tool for a variety of applications. It also enables precise temperature control and real-time test feedback capabilities, making it an ideal choice for engineering and R&D departments.
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