Used ELECTROGLAS 3001 #9071364 for sale

ELECTROGLAS 3001 Prober is a specialized test platform used in Semiconductor Failure Analysis (FA) applications. This state-of-the-art system features a compact, fully integrated design that is quick to setup and easy to use. 3001 is capable of automatically probing any size or type of device, including Wire Bond, Flip Chip, and Microelectromechanical Systems (MEMS). It has a robust construction and offers high reliability, flexibility, and scalability. ELECTROGLAS 3001 Prober is designed for high productivity and offers a wide range of features to help users maximize their testing efficiency. One of the key features is its long-term stability which allows it to correct sample misalignment regardless of the changes in temperature or humidity over long periods of time. It also offers the capability of automatic focus adjustment and a digital zoom option. Additionally, it has the capability of controlling the X-Y-theta stages via programmed macros, which makes it easier to switch between different probe cards. The different components of 3001 include the base station, an insulated work table, variable probes, an X-Y-theta stage, and various other associated electronic equipment. The base station contains the control system, hardware, and software. The insulated work table ensures the safety of the user and the device under test. The variable probes allow for the probing of various types of devices. The X-Y-theta stage provides precise and repeatable motion control for testing, reducing setup time and increasing accuracy. Finally, the associated electronics, such as the power supply, signal amplifier, and oscilloscope, are used to interpret the signals obtained during the testing process. ELECTROGLAS 3001 Prober is designed for extreme accuracy and robustness. It features an automatic calibration process that helps ensure consistent performance over multiple test cycles. It is also ideal for power supply verification testing as it has the capability to measure even the slightest changes in power supply readings. Additionally, 3001 Prober is equipped with special automated features to enable rapid and efficient troubleshooting of device under test (DUT) characteristics. In conclusion, ELECTROGLAS 3001 Prober is a versatile and reliable tool for Semiconductor Failure Analysis. Its compact design and automated functions facilitate quick setup and efficient testing operations. With its long-term stability and advanced features, 3001 Prober provides an ideal solution for testing a wide range of devices.