Used ELECTROGLAS 3001X #144185 for sale

ELECTROGLAS 3001X Prober is a fully automated test equipment designed for the precision probing of semiconductor chips and electro-mechanical devices. It is used to perform a variety of tests and inspections on integrated circuits and other small-scale devices across different applications. 3001X Prober is based on a modular design, which allows the user to customize the system to their specific requirements. It includes an operations console and a mainframe control unit, which provide user interface control and data storage. The prober can be configured with optional accessories and automated multiple arm robots that can access a wide range of test points across the device. ELECTROGLAS 3001X Prober's advanced system design technologies provide efficient testing over a wide range of chip densities and process complexities. It can be used to perform high precision voltage curves, current level measurements, rapid switching sequences, circuit integrity scans and more. The system has a resolution of 1 micron and a repeatability of 0.5 microns, enabling complete control and accuracy of test results. The prober also includes an integrated environmental chamber, which can maintain the device under test in optimal thermal conditions. It also includes a 3D microscope, which allows the user to inspect the status of the device under test and an integrated determination network that adjusts the pressure applied by the probing needles. 3001X Prober also features an advanced data-analysis package, which enables the user to visualize and interpret the results of the test. It can also be integrated with a variety of other testing and processing systems. This helps streamline the testing process and ensure continuous operation. Overall, ELECTROGLAS 3001X Prober is a dependable, high-precision prober designed for use in the semiconductor industry. It features a wide range of features and technologies that enable users to carry out accurate and efficient testing and inspection processes.