Used ELECTROGLAS 3001X #9113384 for sale
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ID: 9113384
Wafer Size: 8"
Automatic wafer prober, 8"
Missing parts:
(4) PCB Boards
PRS Module.
ELECTROGLAS 3001X prober is a device built to accurately detect parameters in a variety of semiconductor and MEMS circuits and materials. It is a versatile instrument with a wide range of capabilities that allows users to efficiently analyze high-density and low-voltage devices. 3001X prober is designed with an automated XY positioning equipment, which works alongside the high-precision Z-axis directional move system to provide accurate positioning for probing or dispensing techniques. This allows it to efficiently identify a large variety of locations in a variety of substrates and materials. Additionally, the prober boasts a fluorescent imaging unit that allows it to accurately detect locations on a wide range of substrates. ELECTROGLAS 3001X has a range of control systems that allow users to conveniently control the movement of the prober. They include a programmable motor controller, a manual jog box, and a vision machine that can be synchronized to the prober's movement levels for precision control. It is designed with a wide range of advanced software features to enable users to automate the probing process and easily monitor progress on their devices. The device is a reliable and user-friendly tool with capabilities such as: probe repetition accuracy; fast programmed testing routines; automated repeatable dispensing; temperature measurement routines; and automatic wafer registry. It also includes various vacuum and pressure control systems for handling various substrates, as well as an advanced substrate detection tool. This tool is deemed a safe option with its modern building material that is impervious and scratch proof. It also has a stable support asset that ensures accuracy and repeatability of placement. Additionally, 3001X offers a variety of XYZ stages, making it suitable for probing a range of substrates. ELECTROGLAS 3001X is an incredibly useful and versatile tool that is able to accurately detect parameters on a variety of semiconductor and MEMS circuits and materials. Its wide array of features allow for precise movements, automated probing, and convenient control systems. It is a reliable and user-friendly tool, designed with advanced safety features for convenient use.
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