Used ELECTROGLAS 3001X #9216751 for sale

ELECTROGLAS 3001X prober is a multi-purpose wafer prober designed to accommodate a variety of test requirements. It features a 28-slot DUT board, multiple laser-level alignment systems, multi-board test optimization, and maximized throughput. With a total travel range of 160mm and a maximum sample size of 50mm, 3001X prober offers maximum test coverage on a wide variety of substrates and wafer sizes. The prober features an advanced software-driven motion control system for precise and repeatable operations. An advanced wafer handling system ensures the proper amount of force is used when contacting the devices on the wafer. The prober is equipped with standard probes and customized probes for specific applications. Acoustic or mechanical probe can be used for probing up to 100 probes on a DUT board. ELECTROGLAS 3001X prober provides various test options and measurement capabilities. Its embedded Automated Test System (ATS) provides diagnostics and fault data analysis options. The prober is capable of measuring from DC to >20GHz, and can provide various applications, including broadband, narrow-band, and broadband + IF. Optional boards allow the user to expand the functionality to measure up to 16-bit analog and digital performance metrics. 3001X prober also offers complete mechanical de-weight test solutions. The prober includes hardware and software designed to mechanically de-weight wafers, resulting in improved wafer yield and reliability. ELECTROGLAS 3001X prober is a perfect choice for high-volume manufacturing and test applications. It is easy to use, offers high accuracy and repeatability, and can be used for a variety of test scenarios. Its superior performance and reliable operation make it a valuable addition to any testing environment.