Used ELECTROGLAS 3100X #9248180 for sale

ELECTROGLAS 3100X prober is a highly advanced wafer probing equipment designed to help advanced semiconductor device test and development. 3100X provides high accuracy and high-speed testing capabilities for complex products such as high speed DRAMs, processors, and ASICs. The system is based on ELECTROGLAS fast and reliable XYZZ Probe Motion Unit, providing reliable positional accuracy and short testing times. ELECTROGLAS 3100X is designed to provide reliable and repeatable test results by incorporating the latest advances in wafer-level testing technology and automation. The machine enables reliable testing through its advanced electrical wafer-level tests including current, capacitance, and ACIV tests, as well as its unique angular probing capability. 3100X enables rapid, accurate testing of memory, microprocessors, ASICs, and other integrated circuit devices. ELECTROGLAS 3100X features a wafer positioner that allows for accurate and repeatable test positioning of wafer lots and reliable wafer loading. The tool also supports advanced wafer illumination for optimal visibility. Additionally, 3100X incorporates powerful software to minimize photon shot noise, yielding improved accuracy and repeatability during testing. Furthermore, the asset supports low-pressure probe contact, ensuring that small probe contact forces are maintained. This minimizes the effects of dielectric hysteresis and maximizes contact lifetime. This allows for repeatable and accurate testing of all types of semiconductor devices. The model also provides high throughput and high accuracy testing, thanks to its integrated motion control module and high-resolution wafer probing equipment. ELECTROGLAS 3100X features an extended probing area for operation over large wafer lots. The system also offers reliable data acquisition for all types of wafer testing. In addition, 3100X provides advanced wafer and IC diagnostics for improved product quality. Finally, ELECTROGLAS 3100X is supported by electrochemical and MEMS metrology systems for comprehensive wafer and IC testing. With its high accuracy and superior speed, 3100X is ideal for examining complex semiconductor devices for development, testing, and production.