Used ELECTROGLAS 4001 #192465 for sale

ELECTROGLAS 4001
Manufacturer
ELECTROGLAS
Model
4001
ID: 192465
Probers.
ELECTROGLAS 4001 is a high-performance prober specifically designed for semiconductor characterization, wafer sort, and yield analyses. The probe station provides a high-precision space for accurately positioning wafers. It consists of a horizontal granite base and mechanism to drive it in X-Y-Z. The spring-loaded cantilever-based probing system is designed to accommodate all wafer sizes up to 200 mm in diameter. It has a substantial 8-inch travel in the X-Y plane, and 127 mm of Z travel to facilitate the fine-tuning needed for placement accuracy. 4001 also features a top-mounted XY table, which allows for the precise movement of a probe tip into the high-impedance environment of a probe card. The XY table allows for the placement of different probe cards over the area being tested, manually or automatically, making it an ideal tool for test operations of semiconductor dies. ELECTROGLAS 4001 has a high-resolution digital video microscope with an adjustable zoom power. This microscope can be used to observe minuscule points on a wafer and for aligning the pressure-less contacting probes with minimal loss of signal quality. The microscope also has a number of digital image storage and manipulation options. In addition, it has an adjustable temperature range from 10℃ to 40℃. The temperature is required to be set in order to minimize thermal expansion and minimize the chance of any of the components failing. The temperature is precisely controlled using PID control which provides an accuracy of up to ±0.1℃. 4001 also has a very important position sensing feature, which assists in the exact placement of the contact probes on the wafer. The position sensing uses an external encoder (similar to the encoders that drive a robotic system) to calculate the exact X, Y and Z coordinates of the probe tips. ELECTROGLAS 4001 also has several built-in safety features. These safety features include an auto shut-off after a given period of time, emergency stop and emergency panic switches, dual-backup water supplies and emergency contact points. Overall, 4001 is a high-performance, reliable prober designed for a variety of semiconductor testing applications. Its high level of accuracy, robust construction, and reliable safety features ensure that it will help improve the quality and speed of testing operations.
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