Used ELECTROGLAS 4080 #9155192 for sale

ELECTROGLAS 4080 is a high-precision, high-speed prober designed for the testing and production of semiconductor components. 4080 is equipped to accurately and quickly measure electrical characteristics, such as size, shape, and material properties. It features a 10-micron probing and precise probe equipment allowing for quick wafer probing and high accuracy. The prober itself has an automated wafer handling system which enables a clean and automatic wafer loading and unloading, with a cycle time as fast as 10 seconds. The prober is built with an eight-point contact unit which pinpoints the test points quickly and accurately. It also provides wafer clamp design on the prober chuck and precise die placement to ensure optimal wafer and die performance. The capacitive style probes used on this machine are designed to detect short-circuits with precision and control. The internal machine is built with closed loop feedback control, which reduces noise and improves accuracy. It also features an offline calibration process and automatic compensation for tool aging and environmental changes, making it highly reliable and accurate. ELECTROGLAS 4080 has the capability of performing high throughput tests and tests with multiple parameters, including DC, AC, Stress, and Parametric capabilities on the same wafer up to 20,000 wafer scans per hour. This speed and accuracy enable operators to quickly and reliably tests semiconductor wafers. The asset also has an intuitive and easy-to-use user interface, which enables operators to quickly monitor, set parameters, make real-time adjustments, as well as access stored test data. Furthermore, 4080 is built with an automated defect analysis model which can stratify data and detect patterns in data, enabling engineers quick analysis of test results and fast repair of failed components. In conclusion, ELECTROGLAS 4080 prober is an efficient and reliable equipment for testing semi-conductors. It is designed with a 10-micron probing system, automated wafer handling, eight-point contact unit, capacitive-style probes, and a highly accurate closed-loop feedback control machine. With its highly accurate and precise capabilities and automated analysis and fault detection capabilities, 4080 is the ideal prober for testing and production of semiconductor components.