Used ELECTROGLAS 4080X DCM2 #9181221 for sale

ELECTROGLAS 4080X DCM2 prober is a highly accurate and precise automated precicion probing tool used for testing and measuring semiconductor devices, such as integrated circuits (ICs) and other microelectronic devices. It is designed to be used in the process of probing and testing, helping to ensure accuracy and repeatability of the results. 4080X DCM2 utilizes advanced Dual Coordinate Measurement (DCM) technology to accurately measure different parameters, including critical dimensions, contact resistance, and current leakage in ICs. The probe card station includes automatic calibration and adjustment, allowing the machine to be easily set-up and operated. The prober is also equipped with high-registration functions, such as a fine alignment sensor and critical dimension tool, which help to maintain exact registration between the structure and probe card. The tool also features advanced pattern recognition and motion control systems that help ensure accuracy and consistency of the probing process. The system also includes non-contact probe tip options, allowing the user to work with different types of samples without the need to re-assemble the tool. ELECTROGLAS 4080X DCM2 is also capable of performing 25-300 high speed measurement cycles per second, making it suitable for testing a wide range of small ICs. The system is also very reliable and offers good accuracy, allowing it to be used for a range of device testing applications. Overall, 4080X DCM2 prober is an excellent choice when it comes to testing and measuring ICs and other microelectronic devices. The highly accurate and precision probing process enabled by the Dual Coordinate Measurement technology and advanced pattern recognition and motion control systems make it a reliable and trustworthy choice for a wide range of applications.