Used ELECTROGLAS 4080X #9107138 for sale

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ELECTROGLAS 4080X
Sold
Manufacturer
ELECTROGLAS
Model
4080X
ID: 9107138
Wafer Size: 8"
Prober, 8" Hot Chuck GPIB Commander 6.0.
ELECTROGLAS 4080X is a sophisticated and powerful prober designed for high-volume integrated circuit (IC) testing. 4080X is capable of accurately testing a wide range of IC products, from low to high complexity. This prober is equipped with an advanced electrical probing mechanism to ensure precise contact between the probe and the IC. The prober employs a switchable interchangeable force drive (IFD) system, which enables different probing configurations for different test requirements. Furthermore, the prober boasts a suite of innovative features that greatly enhances the accuracy of testing. It is equipped with a dither shake table to minimize the effects of ground plane interference, and a high-speed optical positioning system with 99-point calibration that ensures maximum accuracy. This prober can be connected to external test stations or swapped between bin types quickly and easily, allowing for faster testing and high flexibility. ELECTROGLAS 4080X also features an impressive user experience. The intuitive graphical user interface (GUI) provides an easy to use platform for setting up, executing and monitoring test programs. Each prober is outfitted with a triggering system that permits rapid and reliable test sequencing, and the design allows for automatic part loading, unloading, and alignment. This reduces operator fatigue and speeds up operation. 4080X is capable of testing a variety of IC formats, including: SOIC (150 and 200 mils), SOT (240 mils), DIP (330 mils), and QFN/MLF (90 mils). It is designed to support a wide range of testing frequencies, from DC to twelve GHz, making it well suited for testing high-frequency devices. Additionally, the prober can be equipped with up to eight parallel testers to maximize test throughput. ELECTROGLAS 4080X is a reliable and versatile prober suitable for high-volume IC testing. Its unique features and robust construction make it well suited to meet the needs of today's complex and demanding IC testing requirements. Whether used in laboratories or production environments, this prober brings reliability, accuracy and speed to every application.
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