Used ELECTROGLAS 4080X #9372234 for sale

ELECTROGLAS 4080X prober is a highly precise, automated wafer prober used in the semiconductor testing industry. This prober features a standard on-board vision equipment, integrated vacuum chuck, and precise 3-axis motion system. 4080X also provides a high level of flexibility, allowing it to easily adapt to a wide range of testing and probing requirements. ELECTROGLAS 4080X prober has an X-axis accuracy of 0.001 mm and a Y-axis accuracy of 0.005 mm. It has an accuracy rate of up to 5 µm. The precision motion unit is driven by a DC servo motor and is capable of speeds up to 600 mm/s. This motion machine is designed to provide smooth, precise motion to meet the highest performance requirements. The integrated vacuum chuck tool is used for wafer clamping and positioning. 4080X prober comes with a 10-inch vacuum chuck, capable of providing both single and dual-clamping of wafers up to 8" in diameter. This asset also allows for precise alignment of the wafer, while providing a secure grip to eliminate slippage during probing. The integrated optics model that is featured with ELECTROGLAS 4080X prober is capable of both CCD and optical zoom zoom. This optics equipment has 10x resolution and high image clarity, allowing for precise positioning of probe tip to wafer surface. This optics system also comes with an onboard video monitor and support for automated pattern recognition. 4080X prober also has an advanced wafer probing unit that is designed to provide precise, repeatable probing results. The prober is capable of scanning at scan rates up to 4 seconds/wafer, resulting in fast and accurate probing. This advanced scanning machine is designed to reduce the cost and time associated with testing. ELECTROGLAS 4080X prober is a powerful and reliable test stand engineered to the highest industry standards. It features a range of standard features and dual-clamp technology, making it ideal for both device test and production testing. This prober is capable of providing precise, repeatable probing and testing results, making it ideal for a wide range of wafer probing solutions.