Used ELECTROGLAS 4085X #9002579 for sale

ELECTROGLAS 4085X Prober is a full featured and highly versatile prober, ideal for device characterization and troubleshooting. 4085X is designed to be a highly-flexible platform for both test and metrology applications including IV and CV characterization. This ELECTROGLAS prober features a large specimen area with automated XYZ stages, providing fast, accurate, and repeatable positioning. The automated XYZ positioning, computer control, and large displacement range make it ideal for test and characterization tasks in both device fabrication and R&D. The prober also offers flexibility in terms of changing probes, chuck sizes, specimen control, and sample handling. ELECTROGLAS 4085X is equipped with an advanced, high-speed data acquisition system, allowing for simultaneous scanning of multiple point measurements. The prober can also be equipped with a variety of probe controllers, including a self-controlled, pressure sensitive bridge that automatically compensates for variations in specimen size and contact area. This allows for high-accuracy, repeatable measurements. Additional features of the prober include up to 7 total probe heads, electronic beam current display, automatic chuck alignment, and user-defined tester and prober configuration options. The prober has been designed with safety in mind and is equipped with a variety of safety features, such as an emergency stop switch, a low-voltage power supply, and open/short circuit protection. 4085X Prober is an excellent choice for any device testing and characterization needs. Its combination of advanced features, flexibility, and safety makes it a powerful prober for reliable and accurate tests. Its ease-of-use and range of options make it a great choice for both small and large-scale application requirements.