Used ELECTROGLAS 4085X #9026043 for sale

ELECTROGLAS 4085X Prober is an automatic wafer probe tester used to measure the electrical characteristics of semiconductor devices. It is designed to handle a wide variety of probe card designs, and is capable of testing wafers up to six-inches in diameter. The prober is also equipped with an advanced electrical interface and logic compatible with industry standard automation. 4085X Prober features an advanced automated sample handling system to ensure accuracy and speed of test. This system allows for automatic placement, loading, alignment, and unloading of samples onto the probe station. The prober utilizes a large motors and precision mechanical stages to accurately position the probe tip for precise electrical contact with the device under test. The wafer plane has to be maintained and leveled during testing for accurate results. Integral safety features include a protective housing for capturing particles and debris generated during testing, and ESD protection to guard against electrical discharges that may occur during testing. The prober is also equipped with high speed data acquisition, and is capable of measuring voltage, capacitance, and resistance. On-board windows-based application software allows users to program and run tests and acquire measurement results quickly and accurately. ELECTROGLAS 4085X Prober also supports test scheduling with on-board configuration options. Multiple correlation sites, memory test patterns, switching allowances, Z-height testing, and sleep mode are also supported. The prober has a die size range of 600um - 3.5mm, and is built to TIV standards. 4085X Prober has advanced capabilities to ensure accurate and reliable results. Its automation and data handling features allow technicians to measure and analyze device parameters with speed and accuracy. It also provides excellent protection against electrical discharges and debris generation, ensuring that device testing is conducted safely and effectively.